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AMPLIFIER SPECTRAL PURITY/PHASE NOISE USING PXI-5421 & PXI-5122 INSTRUMENT MODULES
 

Author(s):

John Payne, Niksar Australia Pty Ltd, Melbourne Australia
 

Industry:

Telecommunications, Manufacturing & Test
 

Product:

PXI-5421, PXI-5122, NI 8350/MXI-4 & LabVIEW 7.1
 

The Challenge:

To efficiently and quickly measure the single-sided noise sidebands of a high powered H.F. amplifier system (spectral purity and phase noise) with a frequency resolution of 1 Hz and resolving spectral levels down to -110dBc. This requires a system with high dynamic range and low effective noise sidebands close in to the carrier signal.
 

The Solution:

Using National Instruments PXI Modules, and LabVIEW to generate a reference signal to drive the amplifier, to capture the amplifier output signal and compute the required spectral information using the LabVIEW 7.1 environment, a system that meets these requirements was engineered. The system processor used was the NI 8350 connected to the PXI instrument rack using an MXI-4 interface. The processor used was a 3.0 GHz Pentium 4 with hyper-threading technology with 2.5 GByte of RAM fitted. The PXI-5122 digitiser used had 256 MByte of memory fitted.
 

Abstract

The measurement of the spectral noise contributed by an amplifier unit under test (UUT) in regions close to the frequency of the main carrier signal is necessary to obtain an assessment of the suitability of the amplifier for applications requiring sensitive measurement of amplitude, phase and frequency characteristics of  a signal. Often it is necessary to employ expensive noise measuring test equipment for this purpose, but by using the NI PXI-5421 arbritrary waveform generator with the NI PXI-5122 high performance digitiser, with large memory capacity installed good performance can be achieved.
 

Discussion

To measure the characteristics of a signal to a resolution of 1 Hz requires the capture of a minimum of 1 second of signal data. When operating at HF, the avoidance of aliasing errors & artefacts requires setting a sampling regime that gives a sampling rate at least twice the upper frequency of interest, and generally higher than that for a margin. In transforming from the time domain to the frequency domain, it is customary to use a weighting window to reduce the effects of discontinuity between the start and end of the series. This introduces unwanted frequency domain artefacts and reduces the frequency resolution, and the close-in dynamic range. To avoid the artefacts of time series windowing, the carrier frequency, the sampling rate and the number of carrier cycles has to be carefully selected to obviate the need for applying time series weighting. Strict adherence to capturing an integer number of carrier cycles is required as is maintaining a sampling regime wherein there is an integer number of samples per carrier cycle.

To reduce the level of noise contribution from the instruments, it is necessary to maintain coherent signal generation and sampling such that the instrument-generated quantising noise is minimised and differential clocking drifts are eliminated.

Signal Processing

After signal capture, the large amount of data has to be managed to minimise the use of processing resources (memory and CPU time) and to derive the required frequency spectrum with the desired high resolution. This was achieved by carrying out initial processing of the captured data block by block to reduce the amount of data being transformed. Final processing and normalisation of the data was achieved efficiently to obtain the desired frequency spectrum for testing against the specification limits (an analysis bandwidth of 7500 Hz with respect to carrier was readily obtained).
 

Spectral (ensemble) averaging was applied to arrive at a smoothed (average) spectrum. During the averaging process, for each data acquisition, the relative gain and phase stability of the instrumentation (AWG and Digitiser) were measured and plotted. The following plot is indicative of the performance of these two units when coherently producing and processing a signal over a time period of ~6 minutes (1.2 minutes per sample).

Instrument Gain and Phase Stability during Acquisition & Processing

Instrument performance

Based on the individual specifications for the two PXI instrument modules used, it may be concluded that the required performance could not be achieved. Based on the noise level, SFDR and THD specifications for these instruments, one could conclude that ~75 dBc would be the best achievable. However, by applying sound signal processing practices available within LabVIEW to the signals produced and sampled by the NI modules, considerably better performance is available for examination of the spectral purity and phase noise characteristics of a UUT.

The actual performance achieved is summarised in the following table and figures.

 

PARAMETER PERFORMANCE
Carrier frequency range :  HF band (variable)
Size of data capture :  up to 100 Msamples on each channel
Frequency resolution :   1 Hz
Instrument Noise floor :   -105 dBc (approx) @ 1 Hz from carrier

 -120 dBc (approx) @ 40 Hz from carrier

Time to Process :   ~6 minutes

 

Example Plots of Instrument Noise Floor

 

View of the Spectral performance of the Instrument

View of the instantaneous spectra for the Instrument

 

Live Measurement Screen

 

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Last modified: 03-Sep-2010